Carbon Features On 4h And 6h-Sic Using Atomic Force Microscopy
Abstract
Carbon nanotubes are considered to be the building blocks of nanotechnology on the basis of their nanosize and unique electrical properties. The physical and electrical characteristics of carbon nanotubes establish them as excellent devices to be utilized in the advancement of technology. Much research has been dedicated to the characterization and identification of carbon nanocaps. In the present research, molecular beam epitaxy was employed to produce 1 sample of 4H-SiC and 2 samples of 6H-SiC. The 4H- SiC and 6H-SiC were annealed at 1400aC at a base pressure of 10-5 torr. Atomic Force Microscopy measured the topography and electrical characteristics of the various SiC sample surfaces with sub nanometer scale resolution. Five regions on each sample were chosen for AFM analysis as well as production of voltage curves for the respective areas. Regions on the AFM images indicated two distinct types of carbon features. Circular carbon features on the areas on the......
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Approximate Word Count: 927
Approximate Pages: 4 (250 words per double-spaced page)
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Carbon Features On 4h And 6h-Sic Using Atomic Force Microscopy
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Carbon nanotubes are considered to be the building blocks ...
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